Difference: SWSPATSTAT (1 vs. 3)

Revision 32010-08-18 - TheresiaFreska

META TOPICPARENT	name="SoftwareCodes"

SPATSTAT 1.9-7

Below is the detail information:

DEVELOPED	2003-2006 Distribution version 1.9-7 for R
AUTHOR	Written by Adrian Baddeley www.maths.uwa.edu.au/~adrian/ and Rolf Turner www.math.unb.ca/~rolf/
PLATFORM	Library in R for the statistical analysis of spatial point patterns, The code will run under Windows or UNIX.
PURPOSE	Functions for point pattern analysis
FUNCTIONS	ESDA + display and manipulation of point patterns in the plane + exploratory data analysis + simulation + parametric model-fitting using maximum pseudo-likelihood The window of observation for the point pattern may have arbitrary shape (represented by a binary image mask, a polygon, or several polygons with holes). The points of the pattern may have marks. You will find there also hypothesis tests and diagnostics Point process models can be fitted to point pattern data

Changed:

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CODES

R codes are available from the homepage as well as from www.cran.r-project.org/src/contrib/Descriptions/spatstat.html

>
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CODES

R codes are available from the homepage as well as from www.cran.r-project.org/src/contrib/

HOMEPAGE

Home: www.spatstat.org

Revision 22010-08-02 - TheresiaFreska

META TOPICPARENT	name="SoftwareCodes"

SPATSTAT 1.9-7

Below is the detail information:

DEVELOPED	2003-2006 Distribution version 1.9-7 for R
AUTHOR	Written by Adrian Baddeley www.maths.uwa.edu.au/~adrian/ and Rolf Turner www.math.unb.ca/~rolf/
PLATFORM	Library in R for the statistical analysis of spatial point patterns, The code will run under Windows or UNIX.
PURPOSE	Functions for point pattern analysis
FUNCTIONS	ESDA + display and manipulation of point patterns in the plane + exploratory data analysis + simulation + parametric model-fitting using maximum pseudo-likelihood The window of observation for the point pattern may have arbitrary shape (represented by a binary image mask, a polygon, or several polygons with holes). The points of the pattern may have marks. You will find there also hypothesis tests and diagnostics Point process models can be fitted to point pattern data
CODES	R codes are available from the homepage as well as from www.cran.r-project.org/src/contrib/Descriptions/spatstat.html
HOMEPAGE	Home: www.spatstat.org

Deleted:

<
<

-- TWikiAdminUser - 2010-06-25

Revision 12010-06-25 - TWikiAdminUser

META TOPICPARENT	name="SoftwareCodes"

SPATSTAT 1.9-7

Below is the detail information:

DEVELOPED	2003-2006 Distribution version 1.9-7 for R
AUTHOR	Written by Adrian Baddeley www.maths.uwa.edu.au/~adrian/ and Rolf Turner www.math.unb.ca/~rolf/
PLATFORM	Library in R for the statistical analysis of spatial point patterns, The code will run under Windows or UNIX.
PURPOSE	Functions for point pattern analysis
FUNCTIONS	ESDA + display and manipulation of point patterns in the plane + exploratory data analysis + simulation + parametric model-fitting using maximum pseudo-likelihood The window of observation for the point pattern may have arbitrary shape (represented by a binary image mask, a polygon, or several polygons with holes). The points of the pattern may have marks. You will find there also hypothesis tests and diagnostics Point process models can be fitted to point pattern data
CODES	R codes are available from the homepage as well as from www.cran.r-project.org/src/contrib/Descriptions/spatstat.html
HOMEPAGE	Home: www.spatstat.org

-- TWikiAdminUser - 2010-06-25

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